Designed for both routine production inspections and advanced method development, BN Studio brings measurement setup, quality control, reporting, and data management together in one scalable platform.

Xstress Robot for flexible residual stress measurement is now available!

Xstress Profile for depth profiling with Xstress DR45 now available!

When Xstress DR45 was launched, COVID-19 caused lockdowns all over the world and we had no chance to demonstrate the new product in person. Instead we decided to send the system for our long-term partners for try-out to collect feedback. This is the interview of Jonas Holmberg from RISE IVF about their experience.

Safe measurements and motorized movements.

Staying competitive means resource-efficient lightweight construction, intelligent selection of materials, and appropriate heat management and manufacturing technology.

Xstress DR45 is a new generation of X-ray diffractometers that deliver high quality data faster than ever before. The speed and accuracy of the Xstress DR45 takes residual stress measurements beyond the laboratory and into the production line. All-new software with an intuitive, uncomplicated interface pairs with state-of-the art technology to offer seamless efficiency.

X-ray diffraction (XRD) is an industry accepted method for determining residual stress in crystalline materials. This webinar is the second in a series of presentations providing current and future users with useful information on the operating fundamentals of XRD, technological advancements, and commercially available hardware, as well as examples of practical applications. Emphasis is placed on XRD for process optimization/validation and quality control.

Did you know that Barkhausen noise turned 100 years this year? Barkhausen noise was discovered in 1919 by a German physicist named Heinrich Barkhausen. Industrial applications for the Barkhausen method began in 1980 and today it is a widely recognized non-destructive testing method for grinding burn detection, material characterization, and heat treatment defect testing. Follow the timeline and see what has happened over the last 100 years.

The performance requirements of modern components in nearly every industry are ever increasing in parallel with constant efforts to reduce production cost and time. This has placed a greater importance on the understanding and control of process effects such as residual stress. X-ray diffraction (XRD) is a standardized and industry accepted method for determining residual stress in crystalline materials. This webinar provides a comprehensive explanation of the method with an emphasis on the value of residual stress depth profiles.