August 6, 2020

XRD buyback campaign for Xstress product line

We are pleased to announce the launch of a new X-ray diffactometer to the Xstress product line: the Xstress DR45. In celebration of this product launch, we are offering a buyback campaign for any X-ray diffraction system from any manufacturer.

xstress dr45
June 9, 2020

Residual stress measurement faster than ever with new Xstress DR45 X-ray diffractometer

Xstress DR45 is a new generation of X-ray diffractometers that deliver high quality data faster than ever before. The speed and accuracy of the Xstress DR45 takes residual stress measurements beyond the laboratory and into the production line. All-new software with an intuitive, uncomplicated interface pairs with state-of-the art technology to offer seamless efficiency.

Xstress G3 measuring a crankshaft
May 14, 2020

Webinar: Advancements and Applications for Measuring Residual Stress via X-ray Diffraction

X-ray diffraction (XRD) is an industry accepted method for determining residual stress in crystalline materials. This webinar is the second in a series of presentations providing current and future users with useful information on the operating fundamentals of XRD, technological advancements, and commercially available hardware, as well as examples of practical applications. Emphasis is placed on XRD for process optimization/validation and quality control.

March 26, 2020

Stresstech COVID-19 Response and Action

As COVID-19 continues to spread, we are closely monitoring the ever-changing developments of this pandemic. Our first priority is the safety and well-being of our employees, customers, partners, and communities we surround ourselves with each day, while continuing to serve our customers and preserving the strength of our business. Our thoughts are with those directly affected by the virus and we wish to express our sincerest gratitude to those who find themselves on the frontline of the national efforts to combat the virus.

RoboScan S
December 12, 2019

100 Years of Barkhausen Noise

Did you know that Barkhausen noise turned 100 years this year? Barkhausen noise was discovered in 1919 by a German physicist named Heinrich Barkhausen. Industrial applications for the Barkhausen method began in 1980 and today it is a widely recognized non-destructive testing method for grinding burn detection, material characterization, and heat treatment defect testing. Follow the timeline and see what has happened over the last 100 years.

Xstress accessories closeup
September 5, 2019

Webinar: Residual Stress Determination via X-ray Diffraction

The performance requirements of modern components in nearly every industry are ever increasing in parallel with constant efforts to reduce production cost and time. This has placed a greater importance on the understanding and control of process effects such as residual stress. X-ray diffraction (XRD) is a standardized and industry accepted method for determining residual stress in crystalline materials. This webinar provides a comprehensive explanation of the method with an emphasis on the value of residual stress depth profiles.