May 14, 2020
Webinar: Advancements and Applications for Measuring Residual Stress via X-ray Diffraction
X-ray diffraction (XRD) is an industry accepted method for determining residual stress in crystalline materials. This webinar is the second in a series of presentations providing current and future users with useful information on the operating fundamentals of XRD, technological advancements, and commercially available hardware, as well as examples of practical applications. Emphasis is placed on XRD for process optimization/validation and quality control.