Company news

The performance requirements of modern components in nearly every industry are ever increasing in parallel with constant efforts to reduce production cost and time. This has placed a greater importance on the understanding and control of process effects such as residual stress. X-ray diffraction (XRD) is a standardized and industry accepted method for determining residual stress in crystalline materials. This webinar provides a comprehensive explanation of the method with an emphasis on the value of residual stress depth profiles.
New Article by James Thomas and Stephen Kendrish Featured in Gear Solutions magazine, January 15, 2019
Welcome to the 13th international conference of Barkhausen noise and micromagnetic testing.
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In September 2018, Flight Global reported on an incident that occurred on a commercial aircraft in which an axle fatigue crack led to a failure of the left nose landing gear axle and separation of the left nose wheel. “The cause of the abusive grinding could not be determined, but the abusive grinding would probably have been identified if a post-grinding Barkhausen inspection had been carried out.”
See the hidden damages with RoboScan. New video now available.
Check out GearScan 500 video. GearScan 500 allows for fast detection of common manufacturing problems such as grinding re-temper burn, heat treatment, and stress related defects.
A webinar on Non-destructive Case Depth Analysis Using Barkhausen Noise hosted by ASM international.
The 12th International Conference on Barkhausen Noise and Micromagnetic Testing - ICBM12 - will be held in Dresden, Germany, on Sept. 25-26, 2017.
Interview with Gary S. Schajer. Gary S. Schajer is Professor of Mechanical Engineering at the University of British Columbia, Vancouver, Canada. He has come to Stresstech to focus on the writing of his new book on residual stress measurements using hole-drilling method.
Interview with Dominik Dapprich, Managing Director of Stresstech Gmbh MFN International Vol. 18, July Issue, Year 2017
Nova Instruments LLC, a Boston, Massachusetts, USA based test and measurement company, with an extensive portfolio of non-destructive testing technology and solutions, has acquired Stresstech Oy. The addition and integration of Stresstech into the Nova Instruments’ group will secure Stresstech’s long-term growth objectives. Stresstech’s products will further complement the range of non-destructive testing solutions offered by Nova Instruments’ existing portfolio of businesses.