Webinar: Advancements and Applications for Measuring Residual Stress via X-ray Diffraction

Wed, May 20, 2020 9:00 PM - 10:00 PM EEST

X-ray diffraction (XRD) is an industry accepted method for determining residual stress in crystalline materials. This webinar is the second in a series of presentations providing current and future users with useful information on the operating fundamentals of XRD, technological advancements, and commercially available hardware, as well as examples of practical applications. Emphasis is placed on XRD for process optimization/validation and quality control.

In this webinar, attendees will learn about:
  • Theory and background on the use of x-ray diffraction in determining residual stress
  • State-of-the-art features of this technology
  • Application examples highlighting the best uses of the XRD method
Webinar Presenters:
  • James Thomas, General Manager, American Stress Technologies
  • Wade Gubbels, Applications Engineer, American Stress Technologies

Register here