Residual Stress Determination via X-ray Diffraction: A Tool for Control, Validation, and Development

Wed, Sep 18, 2019 9:00 PM - 10:00 PM EEST
Speakers: James Thomas, General Manager & Wade Gubbles, Applications Engineer


Description: The performance requirements of modern components in nearly every industry are ever increasing in parallel with constant efforts to reduce production cost and time. This has placed a greater importance on the understanding and control of process effects such as residual stress. X-ray diffraction (XRD) is a standardized and industry accepted method for determining residual stress in crystalline materials. This webinar provides a comprehensive explanation of the method with an emphasis on the value of residual stress depth profiles.

In this webinar, attendees will learn about:
  • Theory and background on XRD
  • Advantages and limitations of the method
  • State-of-the-art capabilities
  • Real-world examples highlighting applications across industry and academia, including machining induced stress determination, surface treatment quality control, and model and process validation in additively manufactured components