Xstress G2R

X-ray diffractometer Xstress G2R represents advances in design and construction, which provide enhanced reliability and function in a truly portable residual stress and retained austenite analyzer. Bi-axial and tri-axial stress state analysis is effortless and automated with rotating diffractometer.

Xstress G2R
  • Non-destructive
  • Suitable for laboratory, factory and ­field use
  • Rotating diffractometer enables bi-axial and tri-axial stress state analysis
  • Quick assembly, ready to use in 10 minutes
  • Easy replacement of X-ray tube (Cr, Cu, Co, Fe, V, Ti, Mn) which enables measuring different materials
  • Measurement distance 50 mm
  • Two NMOS position sensitive detectors
  • Instantly adjustable 2θ-angle
  • XTronic software for running the measurement and calculating residual stresses and retained austenite content (optional)
  • d-sin²χ and Ω-measurement modes as a standard