xSTRESS g3

X-ray diffractometer Xstress G3, with modifiable movements gives access to confined spaces and complex geometries. Advances in design and construction provide enhanced reliability and function in a truly portable residual stress and retained austenite analyzer.

Xstress G3 X-ray diffractometer
  • Non-destructive
  • Suitable for laboratory, factory and ­field use
  • Quick assembly, ready to use in 10 minutes
  • Easy replacement of X-ray tube (Cr, Cu, Co, Fe, V, Ti, Mn) which enables measuring different materials
  • Three measurement distances as standard: 50, 75 and 100 mm
  • Two NMOS position sensitive detectors
  • Instantly adjustable 2θ-angle
  • XTronic software for running the measurement and calculating residual stresses and retained austenite content (optional)
  • d-sin²χ and Ω-measurement modes as a standard