Complete X-ray diffractometer now in a single, compact and portable unit.
Xstress Mini is the smallest X-ray diffraction analyzer in the Xstress product line. The lightweight Xstress Mini can be used to measure residual stresses for quality and process control. This unit is easily portable and ideal for measurements on-site, at the factory, or in the laboratory.
- From package to residual stress data in less than 5 minutes
- Two NMOS position sensitive detectors, dual beam X-ray output
- Single irradiation: two exposures measured simultaneously
- χ (Chi) measurement mode