Xstress
Xstress diffractometers are designed for residual stress and retained austenite measurements. This non-destructive technique provides users data with unmatched reliability for quality control assessment.
Our Xstress product line of X-ray diffractometers is suitable for use in the field as well as factory and laboratory settings. From system setup to post measurement analysis, easily understood data is delivered quickly so that no time is wasted in improving your quality inspection process.
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Xstress DR45
Newest generation of X-ray diffractometers delivering high quality data faster than ever before.
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Xstress G2
The Xstress G2 X-ray diffractometer represents advances in design and construction which provide enhanced reliability and function in a truly portable residual stress and retained austenite analyzer.
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Xstress G2R
X-ray diffractometer Xstress G2R represents advances in design and construction, which provide enhanced reliability and function in a truly portable residual stress and retained austenite analyzer. Bi-axial and tri-axial stress state analysis is effortless and automated with rotating diffractometer.
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Xstress G3
A diffractometer with modifiable movements, giving access to confined spaces and complex geometries.
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Xstress Robot
Xstress Robot is capable of making measurements by X-ray diffraction easy and flexible with complicated parts, large or small.
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Xstress Options
Xstress accessories complement the easy to use Xstress family by making measurements even easier, faster, and safer.
Applications
X-ray diffraction is the standard method for measuring surface stresses non-destructively. Additionally, a stress depth profile can be obtained via electropolishing. Xstress diffractometers are useful tools during the product or production development phase and in quality control.
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