Xstress diffractometers are designed for residual stress and retained austenite measurements. This non-destructive technique provides users data with unmatched reliability for quality control assessment.

Our Xstress product line of X-ray diffractometers is suitable for use in the field as well as factory and laboratory settings. From system setup to post measurement analysis, easily understood data is delivered quickly so that no time is wasted in improving your quality inspection process.


xstress applications

X-ray diffraction is the standard method for measuring surface stresses non-destructively. Additionally, a stress depth profile can be obtained via electropolishing. Xstress diffractometers are useful tools during the product or production development phase and in quality control.

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