Xstress DR45 S

Xstress DR45 S 2D includes 2D detectors and no rotation unit. It is perfect for quality control and research experiments for single direction measurements.

• Fast and accurate residual stress measurement
  • Residual stress results (MPa) in less than 45 seconds (1 mm collimator, Cr tube, hardened tool steel, 5/5 tilts)
  • Fast residual stress measurement even with challenging materials with e.g. large grain size or texture
  • Measurement with a small spot size possible in reasonable time
  • Uses traditional and proven sin²ψ measurement method both in modified χ and Ω measurement geometries
• Compact design
  • Compact design enables easy integration into confined spaces, allowing measurements even inside pipes or complex geometries
• Advanced additional features
  • Peak width analysis for hardness evaluation
  • Continuous sweep mode measurement

Modular system allows you to invest in essential capabilities now, with the flexibility to upgrade later as your needs evolve. To complement the Xstress DR45 there are options available for e.g. retained austenite measurement and automated mapping features.

Xstress DR45, diffractometer

• The Xstress DR45 X-ray diffractometer features a precision-engineered, robust body designed to maximize stability and measurement accuracy
• Its construction supports precise, software-controlled tilting of the X-ray tube head by ±45°, enabling both stepwise adjustments and smooth, continuous tilting for versatile measurement capabilities
• Uses traditional and proven sin²ψ measurement method both in modified χ and Ω measurement geometries

Tripod for Xstress DR45

• Magnetic legs, equipped with height adjustment, securely attach the device to the measurement surface. The adjustable height feature allows for accurate positioning and measurement of components of varying sizes

2D detector set for Xstress DR45

2D detectors provide efficiency in XRD analysis. 2D detectors ensure faster and more accurate measurement even with difficult materials.

• 2D detectors, 2 pieces
  • Quantum efficiency >90%, at 5 keV
  • 256 × 256 pixels with pixel size 55 µm
  • No dark current
• Detector arc for 2D detectors, standard
  • 2θ-range of the detectors:
    • Adjustable within 127–165°
    • Indexed positions 135°/140°/145°/150°/156.4°

Xstress MU

The Xstress main unit provides reliable power and control for the X-ray diffractometer, ensuring precision and operational safety. Designed for ergonomic mobility, it features integrated handles and wheels for effortless transport and setup.

• Freely adjustable X-ray power supply: 5–30 kV / 0–10 mA, adjustable within safe operational limits
• Self-contained liquid cooling system: Ensures optimal thermal management and continuous operation
• Comprehensive safety interlocks: All required safety features integrated for complete user protection
• Touchscreen interface: Provides real-time hardware status monitoring and intuitive control

X-ray tube

High voltage interchangeable X-ray tube with water-cooled design ensures optimal temperature stability.

• Chromium (Cr) as standard. Easy replacement of X-ray tube (Cr, Cu, Co, Fe, V, Ti, Mn) which enables measuring different materials
• Max. output 30 kV/9 mA/270 W

Xstress Studio

An advanced X-ray diffraction software seamlessly control hardware and achieve accurate stress and diffraction data analysis. Our powerful tool ensures reliability in depth distribution and mapping measurements.

• Measurement control and data analyzing
  • Enhanced diffraction peak width (FWHM) analysis for hardness evaluation
• Measurement visualization
• Hardware operation control
• Follows the standard EN 15305:2008

Measuring accessories

• Different sized collimators for optimizing measurement area and measurement time
  • 0.5/1/2/3/4 mm spot sizes
• Set of stress-free powder samples for distance calibration
  • Fe Ferritic/Fe Austenitic/Al
• Accessories for system maintenance e.g. spare fuses

System accessories

• Power cable for Xstress MU
• Ethernet cable for connecting Xstress MU to computer
• Complete tool set for the system adjustment and maintenance
• X-ray refill bottle designed for easy and safe addition of cooling liquid to the system

Documentation

• Comprehensive user documentation designed to support smooth, efficient operation in daily use

Transport cases

• Aluminum transport packages for system delivery and storage

Modular & Future-Ready

• Xstress DR45 is designed with a modular architecture, allowing you to add new features and upgrades. See the list of additional features on “Xstress Options” presentation.

Xstress DR45 S 1D includes 1D detectors and no rotation unit. It is a perfect and compact base level system for quality control and research experiments for single direction measurements.

• Accurate residual stress measurement
  • Accurate and reliable residual stress measurement with wide range of standard materials
  • Uses traditional and proven sin²ψ measurement method both in modified χ and Ω measurement geometries
• Compact design
  • Enables easy integration into confined spaces, allowing measurements even inside pipes or complex geometries

Modular system allows you to invest in essential capabilities now, with the flexibility to upgrade later as your needs evolve. To complement the Xstress DR45 there are options available for e.g. retained austenite measurement and automated mapping features.

Xstress DR45, diffractometer

• The Xstress DR45 X-ray diffractometer features a precision-engineered, robust body designed to maximize stability and measurement accuracy
• Its construction supports precise, software-controlled tilting of the X-ray tube head by ±45°, enabling both stepwise adjustments and smooth, continuous tilting for versatile measurement capabilities
• Uses traditional and proven sin²ψ measurement method both in modified χ and Ω measurement geometries

Tripod for Xstress DR45

• Magnetic legs, equipped with height adjustment, securely attach the device to the measurement surface. The adjustable height feature allows for accurate positioning and measurement of components of varying sizes

Detector set

1D detectors offer standard capabilities for XRD measurements. 1D detectors are efficient on XRD friendly materials.

• 1D detectors, 2 pieces
  • Quantum   efficiency ~5 %, at 5 keV
  • 1 × 256 pixels with 50 µm pixel width
  • Dark current measurement needed
• Detector arc 50 mm
  • Detector position manually adjustable to cover 2Θ range 110° to 165°

Xstress MU

The Xstress main unit provides reliable power and control for the X-ray diffractometer, ensuring precision and operational safety. Designed for ergonomic mobility, it features integrated handles and wheels for effortless transport and setup.

• Freely adjustable X-ray power supply: 5–30 kV/0–10 mA, adjustable within safe operational limits
• Self-contained liquid cooling system: Ensures optimal thermal management and continuous operation
• Comprehensive safety interlocks: All required safety features integrated for complete user protection
• Touchscreen interface: Provides real-time hardware status monitoring and intuitive control

X-ray tube

High voltage interchangeable X-ray tube with water-cooled design ensures optimal temperature stability.

• Chromium (Cr) as standard. Easy replacement of X-ray tube (Cr, Cu, Co, Fe, V, Ti, Mn) which enables measuring different materials
• Max. output 30 kV/9 mA/270 W

Xstress Studio

An advanced X-ray diffraction software seamlessly control hardware and achieve accurate stress and diffraction data analysis. Our powerful tool ensures reliability in depth distribution and mapping measurements.

• Measurement control and data analyzing
• Measurement visualization
• Hardware operation control
• Follows the standard EN 15305:2008

Measuring accessories

• Different sized collimators for optimizing measurement area and measurement time
  • 0.5/1/2/3/4 mm spot sizes
• Set of stress-free powder samples for distance calibration
  • Fe Ferritic/Fe Austenitic/Al
• Accessories for system maintenance e.g. spare fuses

System accessories

• Power cable for Xstress MU
• Ethernet cable for connecting Xstress MU to computer
• Complete tool set for the system adjustment and maintenance
• X-ray refill bottle designed for easy and safe addition of cooling liquid to the system

Documentation

• Comprehensive user documentation designed to support smooth, efficient operation in daily use

Transport cases

• Aluminum transport packages for system delivery and storage

Modular & Future-Ready

• Xstress DR45 is designed with a modular architecture, allowing you to add new features and upgrades. See the list of additional features on “Xstress Options” presentation.

Xstress DR45 S 1D and 2D

Xstress MU

Xstress Studio

• Hardware operation control: detectors, DC motors, power supply, shutter, safety interlock functions, voltage and current, etc.
• Automated calibration with zero stress powder samples to set diffractometer to sample distance
• Project manager for depth distribution measurement and all kinds of mapping measurements
• Library functions for material parameters
• Theoretical peak position calculator for given material and radiation
• Modified χ and Ω measurement modes
• Peak shift determination with the most known methods such as cross-correlation and peak fit methods
• Peak fit with 10 different functions: Gauss, Lorentz, Modified Lorentz, Intermediate Lorentz, Pearson VII, Split Pearson VII, Pseudo-Voigt, Split Pseudo-Voigt, Voigt and Split Voigt
• Calculation of stress tensor and principal stresses
• JSON based project file format
• Conforms to EN 15305:2008 for residual stress analysis with optional retained austenite analysis per ASTM E975-22

Calculation methods

• Data preparation
  • Absorption correction
  • Lorentz correction
  • Polarization correction
  • Background subtraction
  • Constant background
  • Linear background
  • Parabolic background
  • Rachinger correction (K-alpha2 stripping)
  • Smoothing
  • Moving averages
  • Savitzky-Golay
• Peak
  • Maximum intensity (height)
  • FWHM (full width at half maximum)
  • Integral width
  • Area
• Peak shift (diffraction line position determination)
  • Cross-correlation
  • Centroid (center of gravity)
  • Centered centroid (centered center of gravity)
  • Sliding center of gravity
  • Midchord (middle of width at x% height)
  • Parabolic (parabola fit)
  • Peak fit (profile function fit)
  • Gauss profile
  • Lorentz profile
  • Modified Lorentz profile
  • Intermediate Lorentz profile
  • Pearson VII profile
  • Split Pearson VII profile
  • Pseudo-Voigt profile
  • Split Pseudo-Voigt profile
  • Voigt profile
• Normal and shear stress
  • Linear regression
  • Elliptical regression
  • Dölle-Hauk
• Stress tensor
  • Stress tensor without sigma33
  • Stress tensor with sigma33
• Principal stresses
  • Minimum and maximum normal stress
  • Maximum shear stress
  • Equivalent stress
• Statistics
  • Maximum intensity
  • Minimum intensity
  • Intensity ratio and check
  • Maximum area
  • Minimum area
  • Area ratio and check
  • Average FWHM
• Depth profile
  • Depth profile correction

To complement the Xstress family we have a number of options to make measurements even easier, faster, and safer.

See Xstress options page for details.

Diffractometer options

• Detector filters
• Detector arcs for RS
• Retained austenite
• X-ray tubes
• Extended legs
• Collimators
• Cooling

Sample handling

• Mapping (X-Y) devices
• Rotation devices
• Elastic constant devices
• Vices

Enclosures (safety)

• Table for X-ray
• Cabinets
• Safety walls
• Option for enclosures and safety walls

Depth measuring options

• Electropolisher
• Depth measuring stand
• Dial indicator tools

Calibration options

• Powder samples

Other

• Reference samples
• X-ray camera
• PC
• Commissioning & Training
• Language options

X-ray safety – ANSI N43.3 –2008

• Compliant with ANSI N43.3 -2008 and other industry standards for non-medical X-ray instruments.
• Xstress X-ray diffractometers operate at maximum values of 30 kV voltage, 10 mA current and 300 W power. The operating instructions specify the safety procedures for instrument operation.
• We offer IEC 61010 compliant safety enclosures in accordance with applicable national regulations and customer specific safety
• X-ray diffractometer safety regulations in general