This section presents application notes, technical articles, and research highlights that demonstrate how Stresstech measurement technologies are used in practice.
Traditional Nital etching is giving way to Barkhausen Noise Analysis, a faster, traceable, non-destructive method for detecting stress and microstructural changes in aerospace gears that could lead to component failure during use. This shift enhances inspection reliability while enabling automation and sustainability in manufacturing.
Discover how advanced quality control methods like Barkhausen noise testing and X-ray diffraction help aerospace manufacturers enhance reliability, reduce defects, and ensure safety in every mission.
In X-ray diffraction (XRD) the diffracted peak position shift as a function of an incident X-ray beam angle correlates to the residual stress of the sample. The width of the diffracted peak also holds information about the microstructure of the material. In this article the correlation between the peak width and hardness of the material is demonstrated.
The Xstress DR45 XRD system offers a fast and reliable method for surface residual stress detection, making it a valuable tool for initial assessments before applying more complex and time-consuming techniques such as PFIB-DIC.
Two-dimensional X-ray diffraction enables fast grain size analyses of polycrystalline materials. In this article we demonstrate the capability of the Xstress DR45 to measure the grain size in WC powders and in cemented carbides.
Nearly all kinds of sample geometries can be analyzed with Barkhausen noise.
Barkhausen noise analysis can be done even through non-ferromagnetic coatings.
The detection of the case depth with Barkhausen noise measurement is based on the hardness difference of the surface (case) and the interior of the material.
Barkhausen noise method can detect stress and hardness changes before cracks occur, but in some cases, it can be used for crack detection.
In this application study retained austenite measurements with X-ray diffraction (XRD) method were compared between the Xstress DR45 and Xstress G2R X-ray diffractometer systems to compare the measurement durations and the results. The measurements were performed on powder samples with varying levels of retained austenite content.