Webinar: Residual Stress Determination via X-ray Diffraction

The performance requirements of modern components in nearly every industry are ever increasing in parallel with constant efforts to reduce production cost and time. This has placed a greater importance on the understanding and control of process effects such as residual stress. X-ray diffraction (XRD) is a standardized and industry accepted method for determining residual stress in crystalline materials. This webinar provides a comprehensive explanation of the method with an emphasis on the value of residual stress depth profiles.