Residual stress measurement faster than ever with new Xstress DR45 X-ray diffractometer

Xstress DR45 is a new generation of X-ray diffractometers that deliver high quality data faster than ever before. The speed and accuracy of the Xstress DR45 takes residual stress measurements beyond the laboratory and into the production line. All-new software with an intuitive, uncomplicated interface pairs with state-of-the art technology to offer seamless efficiency.


A new generation X-ray diffractometer:

  • Residual stress results (MPa) less than 45 seconds
    (1 mm collimator, Cr tube, hardened tool steel, 5/5 tilts)
  • Residual stress measurement for all users. You don’t need a PhD to work with Xstress DR45
  • New software with improved user interface
    • Templates for frequent measurements
    • Hardware status overview
    • Measurement visualization

Read all the features and product details here Xstress DR45